Pattern Recognition : 32nd Dagm Symposium, Darmstadt, Germany, September 22-24, 2010, Proceedings

Goesele, Michael (EDT); Roth, Stefan (EDT); Kuijper, Arjan (EDT); Schiele, Bernt (EDT); Schindler, Konrad (EDT)

ISBN 10: 3642159850 ISBN 13: 9783642159855
Published by Springer, 2010
Language: English
Condition: New Soft cover

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