Pattern Recognition : 28th Dagm Symposium, Berlin, Germany, September 12-14, 2006: Proceedings

Franke, Katrin (EDT); Müller, Klaus-robert (EDT); Nickolay, Bertram (EDT); Schafer, Ralf (EDT)

ISBN 10: 3540444122 ISBN 13: 9783540444121
Published by Springer, 2006
Language: English
Condition: New Soft cover

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