Pattern Classification. This item is unavailable.
Duda, Richard O.; Hart, Peter E.; Stork, David G.
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Language: English
Published by Wiley-Interscience, 2000
- Hardcover
- Used
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.Goodwill of Silicon Valley
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Condition: Used - Good
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Item description from seller
Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
Seller Inventory # GWSVV.0471056693.G
- Title
- Pattern Classification
- Author
- Duda, Richard O.; Hart, Peter E.; Stork, David G.
- Publisher
- Wiley-Interscience
- Publication year
- 2000
- Condition
- good
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0471056693
- ISBN 13
- 9780471056690
- Edition
- 2nd Edition
The first edition, published in 1973, has become a classic reference in the field. Now with the second edition, readers will find information on key new topics such as neural networks and statistical pattern recognition, the theory of machine learning, and the theory of invariances. Also included are worked examples, comparisons between different methods, extensive graphics, expanded exercises and computer project topics.
"Synopsis" may belong to another edition of this title.
About the Author
RICHARD O. DUDA, PhD, is Professor in the Electrical Engineering Department at San Jose State University, San Jose, California.
PETER E. HART, PhD, is Chief Executive Officer and President of Ricoh Innovations, Inc. in Menlo Park, California.
DAVID G. STORK, PhD, is Chief Scientist, also at Ricoh Innovations, Inc.
PETER E. HART, PhD, is Chief Executive Officer and President of Ricoh Innovations, Inc. in Menlo Park, California.
DAVID G. STORK, PhD, is Chief Scientist, also at Ricoh Innovations, Inc.
"About the title" may belong to another edition of this title.