On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the MM-Wave Range and Beyond

Language: English

Published by River Publishers, 2019

877022112X / 9788770221122

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Andrej RumiantsevThe increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz.

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Title
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the MM-Wave Range and Beyond
Author
Andrej Rumiantsev
Publisher
River Publishers
Publication year
2019
Condition
New
Binding
Hardcover
Language
English
ISBN 10
877022112X
ISBN 13
9788770221122
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moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

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Item16 to 45 business days16 to 45 business days
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