Nonlinear Circuit Simulation and Modeling: Fundamentals for Microwave Design (The Cambridge RF and Microwave Engineering Series)

Pedro, José Carlos; Root, David E.; Xu, Jianjun; Nunes, Luís Cótimos

ISBN 10: 1107140595 / ISBN 13: 9781107140592

Published by Cambridge University Press, 2018

About this Item

Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.

Seller Inventory # 00068326578

Bibliographic Details

• Title: Nonlinear Circuit Simulation and Modeling: Fundamentals for Microwave Design (The Cambridge RF and Microwave Engineering Series)
• Publisher: Cambridge University Press
• Publication Date: 2018
• Language: English
• ISBN 10: 1107140595
• ISBN 13: 9781107140592
• Binding: Hardcover
• Condition: Good

About this title

Synopsis

Discover the nonlinear methods and tools needed to design real-world microwave circuits with this tutorial guide. Balancing theoretical background with practical tools and applications, it covers everything from the basic properties of nonlinear systems such as gain compression, intermodulation and harmonic distortion, to nonlinear circuit analysis and simulation algorithms, and state-of-the-art equivalent circuit and behavioral modeling techniques. Model formulations discussed in detail include time-domain transistor compact models and frequency-domain linear and nonlinear scattering models. Learn how to apply these tools to designing real circuits with the help of a power amplifier design example, which covers all stages from active device model extraction and the selection of bias and terminations, through to performance verification. Realistic examples, illustrative insights and clearly conveyed mathematical formalism make this an essential learning aid for both professionals working in microwave and RF engineering and graduate students looking for a hands-on guide to microwave circuit design.

About the Authors

José Carlos Pedro is a Professor of Electrical Engineering at Universidade de Aveiro, Portugal, and a Senior Researcher at Instituto de Telecomunicações, Portugal, and a Fellow of the IEEE.

David E. Root is Keysight Research Fellow at Keysight Technologies, Inc., and a Fellow of the IEEE. He is a co-author of X-Parameters (Cambridge, 2013) and a co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (Cambridge, 2011).

Jianjun Xu is Senior Device Modeling R&D Engineer at Keysight Technologies, Inc.

Luís Cótimos Nunes is a radio-frequency Research Assistant at Instituto de Telecomunicações, Universidade de Aveiro, Portugal.