New Modeling Concepts for Today's Software Processes : International Conference on Software Process, Icsp 2010, Paderborn, Germany, July 8-9, 2010 Proceedings

Munch, Jurgen (EDT); Yang, Ye (EDT); Schafer, Wilhelm (EDT)

ISBN 10: 3642143466 ISBN 13: 9783642143465
Published by Springer, 2010
Language: English
Condition: New Soft cover

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