New Methods of Concurrent Checking

Language: English

Published by Springer Netherlands Okt 2010, 2010

9048178762 / 9789048178766

Series: Book 20 of 40 - Frontiers in Electronic Testing

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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Softcover

Condition: New

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This item is printed on demand - it takes 3-4 days longer - Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. 192 pp. Englisch.…

Seller Inventory # 9789048178766

Title
New Methods of Concurrent Checking
Author
Michael Gössel
Publisher
Springer Netherlands Okt 2010
Publication year
2010
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
9048178762
ISBN 13
9789048178766
Item weight
300 grams
Dimensions
235x155x11 mm
Series
Book 20 of 40: Frontiers in Electronic Testing

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First item£ 19.50£ 19.50
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BuchWeltWeit Ludwig Meier e.K.

Germany