New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses

Language: English

Published by Jentzsch-Cuvillier, Annette, 2021

3736975201 / 9783736975200

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. KlappentextIn the present work, urgent issues in the reliability qualification of semiconductor devices are addressed, which particularly affect value chains such as those in the automotive industry. These have particularly high requirem.

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Title
New Approaches to Reliability Qualification of Semiconductor Components under Varying and Progressive Stresses
Author
Hirler, Alexander
Publisher
Jentzsch-Cuvillier, Annette
Publication year
2021
Condition
New
Binding
Soft cover
Language
English
ISBN 10
3736975201
ISBN 13
9783736975200
Seller catalogs
Mathematik/Naturwissenschaften/Technik/Medizin

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

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Item16 to 45 business days16 to 45 business days
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