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Nanocharacterisation is a rapidly developing field. Contributions in this book from across the globe provide an overview of the different microscopic techniques for the characterisation of nanostructures.
About the Author:
A I Kirkland is Professor of Materials at Oxford University and the author of over 170 refereed papers. He was awarded "best materials paper" of 2005 by the Microscopy Society of America. Since 2000 he has also been involved in the characterisation of CCD cameras for TEM. His most recent work involves the development of approaches to complex phase extension and diffractive imaging to further improve resolution. J Hutchinson is a Reader in Materials at Oxford University and has published over 300 refereed papers during his career.. He is currently Vice-President of the Royal Microscopical Society (President 2002-2004), and from 2000-2004 was also a member of the Executive Board of the European Microscopy Society. He has also been involved in the development of the world's first double-aberration-corrected electron microscope.
Title: Nanocharacterisation (RSC Nanoscience & ...
Publisher: Royal Society of Chemistry
Publication Date: 2007
Binding: Hardcover
Condition: Like New
Book Type: book