Model-driven development has become the most important new paradigm in software development and has already demonstrated considerable impact in reducing time to market and improving product quality. This book is about systematic, model-driven test processes in the context of UML. As UML provides only limited means for the design and development of test artifacts, a consortium was formed by the Object Management Group (OMG) to develop a UML profile for model-driven testing – the UML Testing Profile (UTP), an official OMG standard since 2005. Written by the original members of this standardization group, this book shows how to use UML to test complex software systems. The authors introduce UTP step-by-step, using a case study that illustrates how UTP can be used for test modeling and test specification. This book is the definitive reference for the only UML-based test specification language, written by the creators of that language. It is supported by an Internet site that provides further information.

About the Author:

Paul Baker is Corporate Portfolio Manager for Testing Technologies of Motorola’s
European System and Software Engineering Research Laboratory.

Zhen Ru Dai is Senior Researcher at the Fraunhofer Institute for Open Communication Systems (FOKUS) with special research interests on system modeling and testing.

Jens Grabowski is Professor for Applied Computer Science in G�ttingen, where he heads a research group on Software Engineering for Distributed Systems.

�ystein Haugen has been involved in standardizing specification and design languages since 1989. He is a Senior Researcher at Sintef and Associate Professor at University of Oslo

Ina Schieferdecker is Professor at the TU Berlin and also heads the research group on modeling and testing at the Fraunhofer Institute for Open Communication Systems (FOKUS).

Clay Williams is the Manager of the Software Quality and Testing Research Group at the IBM T.J. Watson Research Center.

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Model-driven Testing : Using the Uml Testing Profile

Baker, Paul; Dai, Zhen Ru; Grabowski, Jens; Schieferdecker, Ina; Williams, Clay

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