RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

Language: English

Published by SCITECH PUB, 2010

1891121898 / 9781891121890

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&Uumlber den AutorrnrnJianjun Gao received the B.Eng. and Ph.D. degrees from the Tsinghua University, and M. Eng. Degree from Hebei Semiconductor Research Institute. From 1999 to 2001, he was a Post-Doctoral Research Fellow at the Microelect.

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Title
RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors
Author
Gao, Jianjun
Publisher
SCITECH PUB
Publication year
2010
Condition
New
Binding
Hardcover
Language
English
ISBN 10
1891121898
ISBN 13
9781891121890

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
First item£ 42.02£ 42.02
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