Microstructural Characterization of Materials (Paperback)

David Brandon

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Language: English

Published by John Wiley & Sons Inc, New York, 2008

0470027851 / 9780470027851

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Paperback. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…

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Title
Microstructural Characterization of Materials (Paperback)
Author
David Brandon
Publisher
John Wiley & Sons Inc, New York
Publication year
2008
Condition
new
Binding
Paperback
Language
English
ISBN 10
0470027851
ISBN 13
9780470027851
Edition
2nd Edition

AussieBookSeller

Truganina, VIC, Australia

5-star seller

AbeBooks seller since June 22, 2007

Shipping rates from Australia to U.S.A.

Item25 to 45 business days8 to 14 business days
First item£ 28.01£ 33.31
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The Nile Group Pty Ltd

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