Measurement Error : Models, Methods, and Applications

Book 17 of 45: Chapman & Hall/CRC Interdisciplinary Statistics

Buonaccorsi, John P.; Morgan, Byron J.t. (EDT); Keiding, Niels (EDT); Van Der Heijden, Peter (EDT); Speed, Terry (EDT)

Published by Chapman and Hall/CRC, 2023
Language: English
Condition: New Soft cover

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