Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics 2009 : Symposium Held April 14-17, 2009, San Francisco, California, U.s.a.

Gall, Martin (EDT); Grill, Alfred (EDT); Lacopi, Francesca (EDT); Koike, Junichi (EDT); Usui, Takamasa (EDT)

ISBN 10: 1605111295 ISBN 13: 9781605111292
Published by Cambridge University Press, 2009
Language: English
Condition: Used - As new Hardcover

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