Materials, Processes and Reliability for Advanced Interconnects for Micro- and Nanoelectronics 2009: Symposium Held April 14-17, 2009, San Francisco, California, U.s.a.

Gall, M. (Editor)/ Grill, A. (Editor)/ Lacopi, F. (Editor)/ Koike, J. (Editor)/ Usui, T. (Editor)

ISBN 10: 1605111295 ISBN 13: 9781605111292
Published by Cambridge Univ Pr, 2009
Language: English
Condition: New Hardcover

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