Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, 10)

Book 63 of 72: Springer Series in Advanced Microelectronics

Breitenstein, Otwin; Warta, Wilhelm; Schubert, Martin C.

ISBN 10: 3319998242 ISBN 13: 9783319998244
Published by Springer, 2019
Language: English
Condition: New Hardcover

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