LabVIEW Run Four Point Probe Device : Electrical Characterization of Semiconducting Thin Films made easy by Four Point Probe System controlled by LabVIEW

Language: English

Published by LAP LAMBERT Academic Publishing, 2012

3659134821 / 9783659134821

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Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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nach der Bestellung gedruckt Neuware - Printed after ordering - This book is a product of a fascinating research done through an attempt to find a fast and an accurate means of performing I-V measurements across a semiconducting thin film sample by use of a four point probe system that adopts a Van der Pauw symmetry. From the book, the reader will gain vast knowledge in Thin film Physics, elecronic design, computer interfacing computer automation and measurements in LabVIEW platform. The book outlines step-by-step design and fabrication procedures of the probe head and the Van der Pauw switching device. The interfacing of the Keithley SourceMeter 2400 to a LabVIEW running computer via the serial port is also explained in details. The interfacing of the Van der Pauw circuit to the Computer via the parallel port for switching of the probe tips on the sample surface is also addressed. The book further explains the deposition of Cuprous Oxide thin films on a glass substrate by sputtering technique and explores how the deposition parameters affects the I-V characteristics of these thin films. The reader is encouraged to have a keen look at each design step and carefully follow through the block diagram codes for better understanding.

Seller Inventory # 9783659134821

Title
LabVIEW Run Four Point Probe Device : Electrical Characterization of Semiconducting Thin Films made easy by Four Point Probe System controlled by LabVIEW
Author
John Agumba
Publisher
LAP LAMBERT Academic Publishing
Publication year
2012
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
3659134821
ISBN 13
9783659134821
Item weight
227 grams
Dimensions
220x150x9 mm

AHA-BUCH GmbH

Einbeck, Germany

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