Journey to Data Quality

Yang W Lee, Leo L Pipino, James D Funk, Richard Y Wang

ISBN 10: 0262513358 ISBN 13: 9780262513357
Published by MIT Press 00/p /18 S, 2009
Language: English
Condition: Used - Very good Soft cover

Sold by Bahamut Media, Reading, United Kingdom

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Used - Soft cover

Condition: Used - Very good

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