Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications Andrew Thye Shen Wee

Andrew Thye Shen Wee

ISBN 10: 3527349510 ISBN 13: 9783527349517
Published by Wiley-VCH, 2022
Language: English
Condition: Used - Very good Soft cover

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Used - Soft cover

Condition: Used - Very good

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