Introduction to Scanning Tunneling Microscopy Third Edition

C Julian Chen

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Language: English

Published by Oxford University Press Mai 2021, 2021

0198856555 / 9780198856559

Series: Book 11 of 11 - Monographs on the Physics and Chemistry of Materials

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Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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Neuware - The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard reference book and a graduate-level textbook educating several generations of nano-scientists. In Aug. 1992, the co-inventor of STM, Nobelist Heinrich Rohrer recommended: 'The Introduction to Scanning tunnelling Microscopy by C.J. Chen provides a good introduction to the field for newcomers and it also contains valuable material and hints for the experts'. For the second edition, a 2017 book review published in the Journal of Applied Crystallography said 'Introduction to Scanning tunnelling Microscopy is an excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field'. The third edition is a thoroughly updated and improved version of the recognized 'Bible' of the field. Additions to the third edition include: theory, method, results, and interpretations of the non-destructive observation and mapping of atomic and molecular wavefunctions; elementary theory and new verifications of equivalence of chemical bond interaction and tunnelling; scanning tunnelling spectroscopy of high Tc superconductors; imaging of self-assembled organic molecules on the solid-liquid interfaces. Some key derivations are rewritten using mathematics at an undergraduate level to make it pedagogically sound.

Seller Inventory # 9780198856559

Title
Introduction to Scanning Tunneling Microscopy Third Edition
Author
C Julian Chen
Publisher
Oxford University Press Mai 2021
Publication year
2021
Condition
Neu
Binding
Buch
Language
English
ISBN 10
0198856555
ISBN 13
9780198856559
Edition
3rd Edition
Item weight
998 grams
Dimensions
236x150x23 mm
Series
Book 11 of 11: Monographs on the Physics and Chemistry of Materials

AHA-BUCH GmbH

Einbeck, Germany

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AbeBooks seller since August 14, 2006

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