Pages are New and Unused, Front or Back cover is damaged- torn, wrinkled or dented., Used Like New, no missing pages, no damage to binding, may have a remainder mark.

Seller Inventory # ABS-1333-1574

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Bibliographic Details

Title: An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering)
Publisher: Oxford University Press
Binding: hardcover
Condition: LikeNew

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Academic Book Solutions
70-6 Peconic Avenue, Medford, NY, 11763, U.S.A.

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We guarantee the condition of every book as it's described on the AbeBooks web sites. If you're dissatisfied with your purchase (Incorrect Book/Not as Described/Damaged) or if the order hasn't arrived, you're eligible for a refund within 30 days of the estimated delivery date. If you've changed your mind about a book that you've ordered, please use the Ask bookseller a question link to contact us and we'll respond within 2 business days. This does not affect your statutory consumer rights includ...

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