Infrared Ellipsometry on Semiconductor Layer Structures

Language: English

Published by Springer, Springer Vieweg Nov 2010, 2010

3642062288 / 9783642062285

Series: Book 109 of 227 - Springer Tracts in Modern Physics

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This item is printed on demand - Print on Demand Titel. Neuware -The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 208 pp. Englisch.

Seller Inventory # 9783642062285

Title
Infrared Ellipsometry on Semiconductor Layer Structures
Author
Mathias Schubert
Publisher
Springer, Springer Vieweg Nov 2010
Publication year
2010
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
3642062288
ISBN 13
9783642062285
Item weight
324 grams
Dimensions
235x155x12 mm
Series
Book 109 of 227: Springer Tracts in Modern Physics

buchversandmimpf2000

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