An Improved Markov Random Field Design Approach For Digital Circuits : Introducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And MRF Designs

Jahanzeb Anwer

ISBN 10: 3844332634 ISBN 13: 9783844332636
Published by LAP LAMBERT Academic Publishing, 2011
Language: English
Condition: New Soft cover

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