535 pages in very good condition. Volume III, covering the year 1989. Pages are clean and unmarked with black and white illustrations throughout. Page edges are lightly smudged. Bound in yellow card covers with black titles. Some markings on the upper cover and spine. Spine is wrinkled. Lightly worn around the edges. VG Size: 8 1/2 x 11.

Seller Inventory # 232179

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Bibliographic Details

Title

INTEGRATED CIRCUIT METROLOGY, INSPECTION, AND PROCESS CONTROL III

Publisher

SPIE - The International Society for Optical Engineering, Bellingham, WA

Publication Date

1989

Binding

Soft cover

Condition

Very Good

Book Type

Book

Seller catalogs

Science

Store Description

Online bookseller, previously owner of Book Bazaar, established in 1974.

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Seller's business information

J. Wyatt Books
ON, Canada

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Visa, MasterCard accepted. 5% GST will be added to Canadian orders. All books guaranteed as described and may be returned within 5 days of receipt and notification. Restocking charges may apply. Shipping costs are the responsibility of the buyer. AIRmail includes insurance. Surface mail outside Canada and U.S.A. does not include insurance and will be at the buyer's risk. Online books are in a separate location from my bookstore.

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