528 pages in near fine condition. Volume IV, covering the year 1990. Pages are clean and unmarked with black and white illustrations throughout. Page edges are lightly smudged. Bound in yellow card covers with black titles. Lightly worn around the edges. Wrinkled and marked on the spine. Some marks and creases on the lower cover. NF Size: 8 /12 x 11.

Seller Inventory # 232178

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Bibliographic Details

Title

INTEGRATED CIRCUIT METROLOGY, INSPECTION, AND PROCESS CONTROL IV

Publisher

SPIE - The International Society for Optical Engineering, Bellingham, WA

Publication Date

1990

Binding

Soft cover

Condition

Near Fine

Book Type

Book

Seller catalogs

Science

Store Description

Online bookseller, previously owner of Book Bazaar, established in 1974.

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Seller's business information

J. Wyatt Books
ON, Canada

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Visa, MasterCard accepted. 5% GST will be added to Canadian orders. All books guaranteed as described and may be returned within 5 days of receipt and notification. Restocking charges may apply. Shipping costs are the responsibility of the buyer. AIRmail includes insurance. Surface mail outside Canada and U.S.A. does not include insurance and will be at the buyer's risk. Online books are in a separate location from my bookstore.

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