High speed and Highly Accurate Tip-Scanning Atomic Force Microscope | Design Methodology, Control Strategy, and Performance Evaluation for the Tip-scanning Atomic Force Microscope for the Industrial Large Samples

Dong-Yeon Lee

ISBN 10: 3639002709 ISBN 13: 9783639002706
Published by VDM Verlag Dr. Müller, 2013
Language: English
Condition: New Soft cover

Sold by preigu, Osnabrück, Germany

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New - Soft cover

Condition: New

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Ships from Germany to U.S.A.

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