High-Resolution Imaging and Spectrometry of Materials

Language: English

Published by Springer Berlin Heidelberg, Springer Dez 2010, 2010

3642075258 / 9783642075254

Series: Book 60 of 233 - Springer Series in Materials Science

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This item is printed on demand - Print on Demand Titel. Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 456 pp. Englisch.

Seller Inventory # 9783642075254

Title
High-Resolution Imaging and Spectrometry of Materials
Author
Manfred Rühle
Publisher
Springer Berlin Heidelberg, Springer Dez 2010
Publication year
2010
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
3642075258
ISBN 13
9783642075254
Item weight
686 grams
Dimensions
235x155x25 mm
Series
Book 60 of 233: Springer Series in Materials Science

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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