High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology

Orloff, Jon; Swanson, Lynwood; Utlaut, Mark

ISBN 10: 1461352290 ISBN 13: 9781461352297
Published by Springer, 2012
Language: English
Condition: New Soft cover

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