High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology

Orloff, Jon, Swanson, Lynwood, Utlaut, Mark

ISBN 10: 030647350X ISBN 13: 9780306473500
Published by Springer, 2002
Language: English
Condition: Used - As new Hardcover

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Used - Hardcover

Condition: Used - As new

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