Hardware And Software, Verification And Testing : First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers

Ur, Shmuel (EDT); Bin, Eyal (EDT); Wolfsthal, Yaron (EDT)

ISBN 10: 3540326049 ISBN 13: 9783540326045
Published by Springer, 2006
Language: English
Condition: New Soft cover

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