Handbook of Critical Dimension Metrology and Process Control. Proceedings of a conference held 28-29 September 1993 Monterey, California. [= Critical Reviews of Optical Science and Technology Volume CR52].

Monahan, Kevin M.

ISBN 10: 0819413631 ISBN 13: 9780819413635
Published by Bellingham SPIE Optical Engineering Press, 1994
Condition: Used Hardcover

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