Hardcover. Graph Embedding for Pattern Recognition covers theory methods, computation, and applications widely used in statistics, machine learning, image processing, and computer vision. This book presents the latest advances in graph embedding theories, such as nonlinear manifold graph, linearization method, graph based subspace analysis, L1 graph, hypergraph, undirected graph, and graph in vector spaces. Real-world applications of these theories are spanned broadly in dimensionality reduction, subspace learning, manifold learning, clustering, classification, and feature selection. A selective group of experts contribute to different chapters of this book which provides a comprehensive perspective of this field. This book presents the latest advances in graph embedding theories, such as nonlinear manifold graph, linearization method, graph based subspace analysis, L1 graph, hypergraph, undirected graph, and graph in vector spaces. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

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Bibliographic Details

Title: Graph Embedding for Pattern Analysis (Hardcover)
Publisher: Springer-Verlag New York Inc., New York, NY
Publication Date: 2012
Language: English
ISBN 10: 146144456X
ISBN 13: 9781461444565
Binding: Hardcover
Condition: new

About this title

Synopsis

Graph Embedding for Pattern Recognition covers theory methods, computation, and applications widely used in statistics, machine learning, image processing, and computer vision. This book presents the latest advances in graph embedding theories, such as nonlinear manifold graph, linearization method, graph based subspace analysis, L1 graph, hypergraph, undirected graph, and graph in vector spaces. Real-world applications of these theories are spanned broadly in dimensionality reduction, subspace learning, manifold learning, clustering, classification, and feature selection. A selective group of experts contribute to different chapters of this book which provides a comprehensive perspective of this field.

About the Author

Dr. Yun Fu is a professor at the State University of New York at Buffalo
Dr. Yunqian Ma is a senior principal research scientist of Honeywell Labs at the Honeywell International Inc.

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