Gettering and Defect Engineering in Semiconductor Technology XI: Proceedings of the 11th International Autumn Meeting Giens Close to Marseilles, France September 25-30, 2005 (Solid State Phenomena)

B. Pichaud

ISBN 10: 3908451132 / ISBN 13: 9783908451136

Published by Trans Tech Publications, Ltd., 2005

About this Item

Like New. Ships from Multiple Locations.

Seller Inventory # ERICA75439084511325

Bibliographic Details

• Title: Gettering and Defect Engineering in Semiconductor Technology XI: Proceedings of the 11th International Autumn Meeting Giens Close to Marseilles, France September 25-30, 2005 (Solid State Phenomena)
• Publisher: Trans Tech Publications, Ltd.
• Publication Date: 2005
• Language: English
• ISBN 10: 3908451132
• ISBN 13: 9783908451136
• Binding: Paperback
• Condition: Like New
• Book Type: book

About this title

Synopsis

Volume is indexed by Thomson Reuters CPCI-S (WoS).
This proceedings volume contains 126 contributions from the 11th international meeting on Gettering and Defect Engineering in Semiconductor Technology GADEST 2005 held at “La Badine” at the Giens peninsula south of France.

Synopsis

This proceedings volume contains 126 contributions from the 11th international meeting on Gettering and Defect Engineering in Semiconductor Technology GADEST, 2005, held at "La Badine" at the Giens peninsula, south of France. This conference is held bi-annually with the main purpose to be an informal event gathering Eastern and Western researchers and engineers engaged in the field of semiconductor defect physics, materials science and technology. It offers ample time for discussion and informal interactions between scientists coming from all over the world ensuring lively exchanges of opinions and leading to a better understanding of the complex aspects of semiconductor materials (specially Si-based), which over the years was starting to shift from art into real science. The meeting, as well as the proceedings volume is organized in 12 sessions: A - Crystal Growth, B - Nanoelectronics, C - Gettering and Passivation Techniques, D - H, O, N and C Impurities and Defects Modelling, E - Defects and Defect Engineering, F- Point Defects, Dopants and Diffusion, G- Silicon on Insulator, Silicon Germanium Alloys, H- Silicon for Solar Cells, J - Characterisation and Diagnostics, K - Semiconductor Materials other than Silicon, L - Silicon-Based Optoelectronics, and M - Future Aspects.