Fundamentals of Modern VLSI Devices

Taur, Yuan; Ning, Tak H.

ISBN 10: 0521540852 / ISBN 13: 9780521540858

Published by Cambridge University Press, 2003

About this Item

Fairly worn, but readable and intact. If applicable: Dust jacket, disc or access code may not be included.

Seller Inventory # 3IIT5H0069HT_ns

Bibliographic Details

• Title: Fundamentals of Modern VLSI Devices
• Publisher: Cambridge University Press
• Publication Date: 2003
• Language: English
• ISBN 10: 0521540852
• ISBN 13: 9780521540858
• Binding: Soft cover
• Condition: acceptable

About this title

Synopsis

This book examines in detail the basic properties and design, including chip integration, of CMOS and bipolar VLSI devices and discusses the various factors that affect their performance. The authors begin with a thorough review of the relevant aspects of semiconductor physics, and proceed to a description of the design of CMOS and bipolar devices. The optimization of these devices for VLSI applications is also covered. The authors highlight the intricate interdependencies and subtle tradeoffs between those device parameters, such as power consumption and packing density, that affect circuit performance and manufacturability. They also discuss in detail the scaling, and physical limits to the scaling, of CMOS and bipolar devices. The book contains many exercises, and can be used as a textbook for senior undergraduate or first-year graduate courses on microelectronics or VLSI devices. It will also be a valuable reference volume for practicing engineers involved in research and development in the electronics industry.

Review

."..well-written classroom text....this book will also prove valuable to practicing designers and researchers because of the many advanced topics included...covers a wide range of material for its size...The book is logically organized. Both the ideas and the presentation are first-rate. The typesetting and diagrams are superb." Computing Reviews