Fundamentals of Electromigration-Aware Integrated Circuit Design. This item is unavailable.
Language: English
Published by Springer 2018-03-07, 2018
- Hardcover
- New
Seller: Chiron Media, Wallingford, United KingdomChiron Media
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Condition: New
£ 36.66
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Seller Inventory # 6666-GRD-9783319735573
- Title
- Fundamentals of Electromigration-Aware Integrated Circuit Design
- Author
- Jens Lienig, Matthias Thiele
- Publisher
- Springer 2018-03-07
- Publication year
- 2018
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 3319735578
- ISBN 13
- 9783319735573
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
"Synopsis" may belong to another edition of this title.
About the Author
Matthias Thiele is a scientific assistant at Dresden University of Technology, Germany. He received his Ph.D. in the field of electromigration. Currently he works on the reliability of electronic and mechatronic systems.
"About the title" may belong to another edition of this title.