Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

Language: English

Published by Taylor and Francis Ltd, GB, 2025

1032246804 / 9781032246802

Series: Book 16 of 16 - Advances in Materials Science and Engineering

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The structure-property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the author's course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.

Seller Inventory # LU-9781032246802

Title
Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists
Author
Dong ZhiLi
Publisher
Taylor and Francis Ltd, GB
Publication year
2025
Condition
New
Binding
Paperback
Language
English
ISBN 10
1032246804
ISBN 13
9781032246802
Item weight
500 grams
Series
Book 16 of 16: Advances in Materials Science and Engineering

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