Functional Design Errors in Digital Circuits

Language: English

Published by Springer Netherlands Okt 2010, 2010

9048181127 / 9789048181124

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. 224 pp. Englisch.

Seller Inventory # 9789048181124

Title
Functional Design Errors in Digital Circuits
Author
Kai-Hui Chang
Publisher
Springer Netherlands Okt 2010
Publication year
2010
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
9048181127
ISBN 13
9789048181124
Item weight
347 grams
Dimensions
235x155x13 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

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BuchWeltWeit Ludwig Meier e.K.

Germany