Estimating Device Reliability:

Language: English

Published by Springer, Springer Nov 1992, 1992

079239304X / 9780792393047

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This item is printed on demand - Print on Demand Titel. Neuware -Estimating Device Reliability: Assessment of Credibility is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, statistical models should be used. The issue is not making reliability estimates, but is instead their credibility. The credibility questions explored in the context of practical applications include: What does the confidence level associated with the use of statistical model mean Is the numerical result associated with a high confidence level beyond dispute When is it appropriate to use the exponential (constant hazard rate) model Does this model always provide the most conservative reliability estimate Are the results of traditional `random' failure hazard rate calculations tenable Are there persuasive alternatives What model should be used to describe the useful life of a device when wearout is absent When Weibull and lognormal failure plots containing a large number of failure times appear similar, how should the correct wearout model be selected Is it important to distinguish between a conservative upper bound on a probability of failure and a realistic estimate of the same probability Estimating Device Reliability: Assessment of Credibility is for those who are obliged to make reliability calculations with a paucity of somewhat corrupt data, by using inexact models, and by making physical assumptions which are impractical to verify. Illustrative examples deal with a variety of electronic devices, ICsand lasers.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 234 pp. Englisch.

Seller Inventory # 9780792393047

Title
Estimating Device Reliability:
Author
Franklin R. Nash
Publisher
Springer, Springer Nov 1992
Publication year
1992
Condition
Neu
Binding
Buch
Language
English
ISBN 10
079239304X
ISBN 13
9780792393047
Item weight
521 grams
Dimensions
241x160x19 mm

buchversandmimpf2000

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