Energy-Efficient Fault-Tolerant Systems

Jimson Mathew

ISBN 10: 1461441927 / ISBN 13: 9781461441922

Published by Springer New York, Springer New York Sep 2013, 2013

About this Item

Neuware -This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 352 pp. Englisch.

Seller Inventory # 9781461441922

Bibliographic Details

• Title: Energy-Efficient Fault-Tolerant Systems
• Publisher: Springer New York, Springer New York Sep 2013
• Publication Date: 2013
• Language: English
• ISBN 10: 1461441927
• ISBN 13: 9781461441922
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 24D millimeters 241 millimeters width by 160 millimeters height by 24 millimeters depth
• Weight: 694 grams

About this title

Synopsis

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

From the Back Cover

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

· Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability;

· Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches;

· Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.