Energy-Efficient Fault-Tolerant Systems

Jimson Mathew

ISBN 10: 1493945513 / ISBN 13: 9781493945511

Published by Springer New York, Springer US, 2016

About this Item

Druck auf Anfrage Neuware - Printed after ordering - This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

Seller Inventory # 9781493945511

Bibliographic Details

• Title: Energy-Efficient Fault-Tolerant Systems
• Publisher: Springer New York, Springer US
• Publication Date: 2016
• Language: English
• ISBN 10: 1493945513
• ISBN 13: 9781493945511
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 20D millimeters 235 millimeters width by 155 millimeters height by 20 millimeters depth
• Weight: 534 grams

About this title

Synopsis

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

From the Back Cover

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

· Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability;

· Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches;

· Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.