Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series)

Charles Evans; Richard Brundle; Wilson

ISBN 10: 0750691689 / ISBN 13: 9780750691680

Published by Butterworth-Heinemann, Boston, 1992

About this Item

A few pages with minor highlighting.

Seller Inventory # 00042640

Bibliographic Details

• Title: Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series)
• Publisher: Butterworth-Heinemann, Boston
• Publication Date: 1992
• Language: English
• ISBN 10: 0750691689
• ISBN 13: 9780750691680
• Binding: Hardcover
• Edition: First Edition.
• Condition: Very Good to Fine
• Seller catalogs:
  • Physics

About this title

Synopsis

Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.

Review

This book is good but far too expensive. It puts a strain on the students.