Emerging Electronic Devices, Circuits and Systems (Hardcover). This item is unavailable.Emerging Electronic Devices, Circuits and Systems (Hardcover)

The book constitutes peer-reviewed proceedings of a workshop on Emerging Electronics Devices, Circuits, and Systems (EEDCS) held in conjunction with International Symposium on Devices, Circuits, and Systems (ISDCS 2022). The book focuses on the recent development in devices, circuits, and systems. It also discusses innovations, trends, practical challenges, and solutions adopted in device design, modeling, fabrication, characterization, and their circuit implementation with pertinent system applications. It will be useful for researchers, developers, engineers, academicians, and students.

Chandan Giri received B.Tech degree in Computer Science & Engineering from Calcutta University, Kolkata, India in 2000 and subsequently Masters of Engineering (M.E) in Computer Science & Engineering from Jadavpur University, Kolkata, India in 2002 and the Ph.D degree from the Department of Electronics & Electrical Communication Engineering, Indian Institute of Technology, Kharagpur in 2008. He is currently an Associate Professor in the Department of Information Technology, Indian Institute of Engineering Science and Technology, Shibpur, India. His research interests are wireless sensor networks, testing and design-for-testability of integrated circuits (especially 3D and multicore chips), microfluidic biochip design, and testing

Takahiro Lizuka received Ph.D. degree from Hiroshima University, Higashi-Hiroshima, Japan, in 2013. From 1986 to 2012, he was with NEC Corporation, NEC Electronics Corporation, and Renesas Electronics Corporation, where he was involved in carrier transport modeling for TCAD and led a SPICE modeling team during 2003–2012. During these years, he was also with the Semiconductor Technology Academic Research Center, Yokohama, Japan, where he was involved with the development of the HiSIM family models interacting with Hiroshima University as Visiting Researcher. Since 2012, he has been with the HiSIM Research Center, at Hiroshima University, where he is involved in compact modeling, including maintaining, improving, and developing the HiSIM family models. Dr. Iizuka is a Member of IEEE, IEICE (The Institute of Electronics, Information and Communication Engineers, Japan), and JSAP (The Japan Society of Applied Physics), respectively.

Hafizur Rahaman is a Full Professor at the Indian Institute of Engineering Science and Technology (IIEST), Shibpur, India. He was a Royal Society Postdoctoral Research Fellow (2006–2009), at the University of Bristol, UK. During 2013–2015, he was Visiting Professor at the University of Bremen, Germany, under the DST-DAAD Research Scheme. His research interests include the design and testing of integrated circuits, nano-biochips, and emerging nanotechnologies including quantum computing. He has published over 350 research articles in journals and refereed conference proceedings. To his credit, he has supervised 17 doctoral and 46 master theses besides guiding several projects at the undergraduate level. Eight more doctoral theses are now in progress. He leads the VLSI design and test group at IIEST, Shibpur, India.

Bhargab B. Bhattacharya is currently a Distinguished Visiting Professor of Computer Science and Engineering at the Indian Institute of Technology (IIT) Kharagpur. Before that, he had been on the faculty of the Indian Statistical Institute, Kolkata, for over 35 years. He received his B.Sc. degree in physics from the Presidency College, Calcutta, and B.Tech., M.Tech., and Ph.D. degrees from the University of Calcutta, India. Dr. Bhattacharya served as Visiting Professor at the University of Nebraska-Lincoln, and Duke University, USA, University of Potsdam, Germany, Kyushu Inst. of Tech., Japan, Tsinghua University, Beijing, China, National Tsing Hua University, Taiwan, and IIT Guwahati, India. He is a Fellow of the Indian National Academy of Engineering (INAE), a Fellow of the National Academy of Sciences (India), and a Fellow of the IEEE.