Electron microprobe analysis and scanning electron microscopy in geology.. This item is unavailable.Electron microprobe analysis and scanning electron microscopy in geology.

This book describes the important techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM), as used in many branches of geology, including mineralogy, petrology, palaeontology and sedimentology. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible to novices, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

'Dr Reed has produced an excellent and thoroughly readable book and the availability of a paperback version is certain to mean that it reaches a wide audience. Highly recommended for all those who use the electron microprobe.' Allan Pring, Geological Magazine

'Taken as a whole, this is a book that has long been overdue, and will certainly go to the top of my students' reading list.' Eric Condliffe, Journal of Petrology

'Reed ... assumes no prior knowledge, and limits technical detail to the minimum necessary, based on the 'need to know'. The result is by far the most readable of the microscope/microprobe books that I have ever seen ... It is a splendid book that should sit on the bookshelf of anybody working with electron microscopes and microprobes, be part of any laboratory, and be required reading for any graduate student working with microbeam techniques.' Peter Treloar, Geoscientist

'Overall the book gives a good introductory level of information on all the main aspects of scanning electron microscopy and microanalysis that is not so readily available anywhere else ... It is strongly recommended ... an excellent textbook ... The author has achieved his aim and filled a niche, a book for new users, and at a price of £18 in softback it is good value for money.' M. T. Styles, Analyst

' ... most welcome ... This is a clearly written introductory text, lavishly illustrated.' P. W. Hawkes, Ultramicroscopy