Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,

Book 77 of 98: Optical Science and Engineering

Thompson, Brian J. (Series edited by)/ Murr, Lawrence E (Edited by)

ISBN 10: 0824785568 ISBN 13: 9780824785567
Published by Marcel Dekker Inc, 1991
Language: English
Condition: New Hardcover

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