Electron Beam Testing Technology

Language: English

Published by Springer, Springer US Jun 2013, 2013

1489915249 / 9781489915245

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This item is printed on demand - Print on Demand Titel. Neuware -Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.Libri GmbH, Europaallee 1, 36244 Bad Hersfeld 480 pp. Englisch.

Seller Inventory # 9781489915245

Title
Electron Beam Testing Technology
Author
John T. L. Thong
Publisher
Springer, Springer US Jun 2013
Publication year
2013
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1489915249
ISBN 13
9781489915245
Item weight
895 grams
Dimensions
254x178x26 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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