Electromagnetic Measurements in the Near Field
Language: English
Published by SciTech Publishing Inc, US, 2012
- Hardcover
- New
Seller: Rarewaves USA United, HEBRON, KY, U.S.A.Rarewaves USA United
AbeBooks seller since June 20, 2025
Condition: New
£ 93.62
Quantity: Over 20 available
Add to basketItem description from seller
This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understanding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.…
Seller Inventory # LU-9781891121067
- Title
- Electromagnetic Measurements in the Near Field
- Author
- Pawel Bienkowski, Hubert Trzaska
- Publisher
- SciTech Publishing Inc, US
- Publication year
- 2012
- Condition
- New
- Binding
- Hardback
- Language
- English
- ISBN 10
- 1891121065
- ISBN 13
- 9781891121067
- Edition
- 2nd Edition
This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understanding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
"Synopsis" may belong to another edition of this title.
About the Author
Pawel Bienkowski is affiliated with the EM Environment Protection Lab at the Technical University of Wroclaw, Poland where he researches electromagnetic compatibility and electromagnetic field measurements and standards. He is the author or co-author of over 100 publications and over 20 patents.
Hubert Trzaska is a Professor in the EM Environment Protection Lab at the Technical University of Wroclaw, Poland where he researches electromagnetic field measurements and standards. He is a Charter Member of the Bioelectromagnetic Society and is the author or co-author of over 300 publications and over 50 patents.
"About the title" may belong to another edition of this title.
Rarewaves USA United
HEBRON, KY, U.S.A.
AbeBooks seller since June 20, 2025
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