EMC 2008 : 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany : Instrumentation and Methods

Luysberg, Martina (EDT); Tillmann, Karsten (EDT); Weirich, Thomas (EDT)

ISBN 10: 3540851542 ISBN 13: 9783540851547
Published by Springer, 2008
Language: English
Condition: New Hardcover

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