ELLIPSOMETRY OF FUNCTIONAL ORGANIC SURFACES AND FILMS (HB 2014). This item is unavailable.
Language: English
Published by SPRINGER, 2014
- Hardcover
- New
Seller: UK BOOKS STORE, London, London, United KingdomUK BOOKS STORE
5-star seller
AbeBooks seller since March 11, 2024
International Edition
Unavailable
Hardcover
Condition: New
£ 177.62
Item description from seller
Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
Seller Inventory # CVS 9783642401275
- Title
- ELLIPSOMETRY OF FUNCTIONAL ORGANIC SURFACES AND FILMS (HB 2014)
- Author
- HINRICHS
- Publisher
- SPRINGER
- Publication year
- 2014
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 3642401279
- ISBN 13
- 9783642401275
- Edition
- International Edition
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
"Synopsis" may belong to another edition of this title.
From the Back Cover
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
"About the title" may belong to another edition of this title.