The Dopant Density and Temperature Dependence of Electron Mobility and Resistivity in N-Type Silicon (NBS Special Publication 400-33).

Sheng, S. Li and the Electronic Technology Division, Institute for Applied Technology, National Bureau of Standards.

Published by National Bureau of Standards., 1977
Condition: Used - Very good Soft cover

Sold by Eryops Books, Stephenville, TX, U.S.A.

AbeBooks Seller since 11 July 2003

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

View this seller's items


Used - Soft cover

Condition: Used - Very good

Price:
£ 3.64
£ 4.47 shipping
Ships within U.S.A.

Quantity: 1 available

Add to basket