Digital Logic Testing and Simulation

Miczo, Alexander

ISBN 10: 0471603651 / ISBN 13: 9780471603658

Published by Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1986

About this Item

hardcover in very good + condition. Seller Inventory # 109806

Bibliographic Details

Title: Digital Logic Testing and Simulation

Publisher: Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc

Publication Date: 1986

Binding: Hardcover

Condition: Very Good

About this title

Synopsis:

Digital electronics has been the object of a major revolution. Circuits are shrinking in physical size while growing both in their speed and in their range of capabilities. Along with this revolution in hardware, there is a corresponding revolution in the software programs provided with the computer. This rapid advancement is not without its problems, a major one of which is testing. Because of the testing problems arising from the increasing complexity of these devices, new test strategies are emerging. Increasing emphasis is being placed on finding a defect as early as possible in the manufacturing cycle, new algorithms are being devised to create tests for logic circuits, and more attention is being given to design-for-test techniques that require active participation by the logic designers. The first six chapters of this book are concerned with traditional approaches for generating stimuli and applying them to circuits. In Chapter 7 attention is focused on methods for designing testable logic and in Chapter 8 the author looks at some algorithms designed to take advantage of the regularity of memories. In the final chapters, trends and research are examined from different perspectives.

Review:

"...well–written and covers broad subjects related to the test of digital circuits. It will be useful for students and engineers involved in design and testing." ( IEEE Circuits & Devices Magazine, July/August 2005)

This is an excellent introduction to testing digital circuits...valuable to IC design and product engineers, and stands as an excellent academic reference for electrical engineering students. (Chip Scale Review, March 2004)